They are also used in the production of sensors, actuators, and other microelectromechanical devices. In addition to their use in the microelectronics industry, silicon wafers are also used in the biomedical field for applications such as tissue engineering and drug delivery.
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The 76.2mm silicon diameter is a less commonly used size compared to the more standard sizes of 25.4mm and 100mm. It may be used in certain specialized applications where a larger wafer size is required, but a 100mm wafer is too large. The larger size of the 76.2mm wafer allows for the production of more devices on a single wafer, which can be cost-effective for high volume production. However, the larger size also means that the wafer is more fragile and may be more difficult to handle during the manufacturing process.
Silicon wafers are used in a wide range of applications, including electronics, optoelectronics, and photovoltaics.
Note: Surface - P = Polished, E = Etched, C = AsCut, G = Ground, Ox = Oxide (on that surface); Material - CZ unless noted Note: Items sold in quantities of 25, unless noted |
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Item | Material | Orient. | Diam. | Thck | Surf. | Resistivity | Comment |
(μm) | Ωcm | ||||||
4996 | p-type Si:B | [110] ±0.5° | 3" | 325 | P/E | FZ 100-200 | SEMI Prime, 2Flats, Empak cst |
5865 | p-type Si:B | [100] | 3" | 380 | P/E | FZ 7,000-10,000 | SEMI Prime, 2Flats, Empak cst |
B0645 | p-type Si:B | [100] | 3" | 650 | P/E | FZ >3,000 | SEMI, 2Flats, Empak cst |
A0572 | p-type Si:B | [100] | 3" | 500 | P/P | FZ 0.5-10.0 | SEMI Prime, 2Flats, Empak cst |
I246 | p-type Si:B | [100] | 3" | 525 | P/E | FZ 0.5-10.0 | SEMI Prime, 2Flats, Empak cst |
S5901 | p-type Si:B | [100] | 3" | 584 | E/E | FZ 0.5-10.0 | SEMI Prime, 2Flats, Empak cst |
M942 | p-type Si:B | [111] ±0.5° | 3" | 475 | P/E | FZ >4,400 | SEMI Prime, 1Flat, TTV<5μm, Empak cst |
S5554 | p-type Si:B | [111] ±0.25° | 3" | 400 | P/E | FZ >100 | SEMI Prime, 1Flat, Empak cst |
G529 | n-type Si:P | [100] | 3" | 380 | P/P | FZ 7,000-18,000 | Back-Side not Prime, 2Flats, Empak cst |
4994 | n-type Si:P | [100] ±0.1° | 3" | 380 | P/E | FZ >5,000 | SEMI Prime, 1Flat, Empak cst |
10609 | n-type Si:P | [100] | 3" | 400 | P/E | FZ >1,000 | SEMI Prime, 1Flat, MCC Lifetime>200μs, Empak cst |
F421 | n-type Si:P | [100] | 3" | 300 | P/P | FZ 45-52 | SEMI Prime, 2Flats, Empak cst |
E421 | n-type Si:P | [100] | 3" | 380 | P/E | FZ 45-52 | SEMI Prime, 2Flats, Empak cst |
7059 | n-type Si:P | [100] | 3" | 850 | P/E | FZ 40-140 | SEMI Prime, 2Flats, Empak cst |
4987 | n-type Si:P | [100] | 3" | 300 | P/P | FZ 0.8-2.5 | SEMI Prime, 2Flat, MCC Lifetime>7,000μs, Empak cst |
A0529 | n-type Si:P | [100] | 3" | 525 | P/P | FZ 0.5-1.0 | SEMI Prime, 2Flats, MCC Lifetime>1,000μs, Empak cst |
5753 | n-type Si:P | [211-5°] ±0.5° | 3" | 508 | P/P | FZ >50 | Prime, 1Flat, Empak cst |
5750 | n-type Si:P | [211-5°] ±0.5° | 3" | 508 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5752 | n-type Si:P | [211-5°] ±0.5° | 3" | 508 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5755 | n-type Si:P | [211-5°] ±0.5° | 3" | 508 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5756 | n-type Si:P | [211-5°] ±0.5° | 3" | 508 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5757 | n-type Si:P | [211-5°] ±0.5° | 3" | 508 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5758 | n-type Si:P | [211] ±0.5° | 3" | 508 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5754 | n-type Si:P | [211] ±0.5° | 3" | 1,016 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5759 | n-type Si:P | [211] ±0.5° | 3" | 1,016 | P/P | FZ 25-75 | Prime, 1Flat, Empak cst |
5760 | n-type Si:P | [211] ±0.5° | 3" | 1,016 | P/P | FZ 25-75 | SEMI TEST, 1Flat, Empak cst |
G116 | n-type Si:P | [111] ±0.5° | 3" | 415 ±15 | E/E | FZ 10,000-12,000 | SEMI Prime, 1Flat, MCC Lifetime>1,500μs, Empak cst |
5707 | n-type Si:P | [111] ±0.5° | 3" | 370 | P/E | FZ >5,000 | SEMI Prime, 1Flat, Empak cst |
I707 | n-type Si:P | [111] ±0.5° | 3" | 370 | P/E | FZ >5,000 | SEMI TEST (Scratches on polished side), 1Flat, Empak cst |
E116 | n-type Si:P | [111] ±0.5° | 3" | 415 ±15 | E/E | FZ 5,000-7,400 | SEMI Prime, 1Flat, MCC Lifetime>1,500μs, in Empak cst |
F264 | n-type Si:P | [111] ±0.5° | 3" | 675 | P/P | FZ >5,000 | SEMI Prime, 1Flat, TTV<4μm, MCC Lifetime>800μs, Empak cst |
3273 | n-type Si:P | [111] ±0.5° | 3" | 1,000 | P/E | FZ >5,000 | SEMI Prime, 2Flats, Empak cst |
I978 | n-type Si:P | [111] ±0.5° | 3" | 380 | P/E | FZ 4,000-8,000 | SEMI Prime, 1Flat, in hard cassettes of 1 & 2 wafers |
K978 | n-type Si:P | [111] ±0.5° | 3" | 380 | BROKEN | FZ 4,000-8,000 | Broken P/E wafer, 1Flat, Soft cst |
3786 | n-type Si:P | [111] ±0.5° | 3" | 380 | P/P | FZ 3,000-5,000 | SEMI Prime, 1Flat, Empak cst |
E383 | n-type Si:P | [111] ±0.5° | 3" | 380 | P/E | FZ 3,000-5,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
2116 | n-type Si:P | [111] ±0.5° | 3" | 415 ±15 | E/E | FZ 2,000-5,000 | SEMI Prime, 1Flat, MCC Lifetime>1,500μs, Empak cst |
A0609 | n-type Si:P | [111] ±0.5° | 3" | 400 | P/E | FZ >1,000 | SEMI Prime, 1Flat, Lifetime>200μs, Empak cst |
A914 | n-type Si:P | [111] ±1.0° | 3" | 450 | P/P | FZ 182-196 | SEMI Prime, 1Flat, TTV<3μm, Empak cst |
H914 | n-type Si:P | [111] ±1.0° | 3" | 450 | P/P | FZ 182-196 | SEMI Prime, 1Flat, TTV<3μm, Empak cst |
10559 | Intrinsic Si:- | [110] ±0.5° | 3" | 381 | P/E | FZ >10,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
A0483 | Intrinsic Si:- | [100] | 3" | 350 | P/P | FZ >20,000 | SEMI Prime, 1Flat, TTV<1μm, MCC Lifetime>1,000μs, Empak cst |
A996 | Intrinsic Si:- | [100] | 3" | 350 | P/E | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
A210 | Intrinsic Si:- | [100] | 3" | 370 | P/P | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
C0128 | Intrinsic Si:- | [100] | 3" | 380 | P/E | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
D0128 | Intrinsic Si:- | [100] | 3" | 380 | P/E | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
G0128 | Intrinsic Si:- | [100] | 3" | 380 | P/E | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
K834 | Intrinsic Si:- | [100] | 3" | 380 | P/E | FZ >20,000 | SEMI TEST (unpolished side has stain), 1Flat, Empak cst |
10422 | Intrinsic Si:- | [100] | 3" | 381 | P/E | FZ >20,000 | SEMI Prime, 1Flat, TTV<5μm, Bow<10μm, Warp<15μm, MCC Lifetime>1,000μs, Empak cst |
A307 | Intrinsic Si:- | [100] | 3" | 500 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
A0012 | Intrinsic Si:- | [100] | 3" | 6,000 | P/P | FZ >20,000 | Prime, NO Flats, MCC Lifetime>1,200μs, Individual cst |
10266 | Intrinsic Si:- | [100] | 3" | 380 | P/E | FZ >10,000 | SEMI Prime, 1Flat, TTV<15μm, MCC Lifetime>1,000μs, Empak cst |
10271 | Intrinsic Si:- | [100] | 3" | 380 | P/E | FZ >10,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
10838 | Intrinsic Si:- | [100] | 3" | 500 | P/E | FZ >10,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
A843 | Intrinsic Si:- | [100] | 3" | 700 | P/P | FZ >10,000 | SEMI Prime, 1Flat, TTV<1μm, MCC Lifetime>1,000μs, Empak cst |
6101 | Intrinsic Si:- | [100] | 3" | 4,000 | P/P | FZ >8,000 | SEMI TEST (Scratched), 1Flat, Individual cst |
A0156 | Intrinsic Si:- | [111] ±0.5° | 3" | 350 | P/P | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
10624 | Intrinsic Si:- | [111] ±0.5° | 3" | 380 | P/E | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
I667 | p-type Si:B | [110] ±0.5° | 3" | 380 | P/E | >100 | SEMI Prime, Primary Flat @ [111], Secondary @ [111] 70.5° from Primary, in hard cassettes of 1, 2 & 2 wafers |
5928 | p-type Si:B | [110] | 3" | 750 | P/E | >100 | SEMI Prime, 2 Flats at [111], Secondary 70.5° from PF, Empak cst |
1988 | p-type Si:B | [110] ±0.5° | 3" | 380 | P/E | >60 | SEMI Prime, Primary Flat @ [111], Secondary @ [111] 70.5° from Primary, Empak cst |
S5806 | p-type Si:B | [110] ±0.5° | 3" | 860 | E/E | 15-50 | SEMI, 2Flats, Empak cst |
3780 | p-type Si:B | [110] ±0.25° | 3" | 380 | P/E | 2--4 | SEMI Prime, 2Flats {PF at [111], SF at [111] CW 109.5° from PF}, Empak cst |
H173 | p-type Si:B | [110] ±0.5° | 3" | 381 | P/E | 0.085-0.115 | SEMI Prime, Primary Flat @ [111]±0.5°, Secondary @ [111] 109.5° CW from Primary, in Epak cassettes of 7 wafers |
2714 | p-type Si:B | [110] ±0.3° | 3" | 381 | P/E | 0.0448-0.0672 | SEMI Prime, 2Flats {PF at [111], SF at [111] CW 109.5±2° from PF}, hard cst |
E455 | p-type Si:B | [110] ±0.5° | 3" | 381 | P/E | 0.003-0.005 | SEMI Prime, Primary Flat @ [111]±0.5°, Secondary Flat @ [111] (109.5±2° CW from Primary), Empak cst |
10687 | p-type Si:B | [100] | 3" | 380 ±15 | P/E | 10-20 {10.66-16.91} | SEMI Prime, 1Flat, Empak cst, TTV<5μm |
B183 | p-type Si:B | [100] | 3" | 380 | P/E | 10--20 | SEMI TEST (Unsealed, can be recleaned), 2Flats, Empak cst |
10339 | p-type Si:B | [100] | 3" | 380 ±15 | P/E | 5--10 | SEMI, 2Flats, TTV<5μm, Empak cst |
10686 | p-type Si:B | [100] | 3" | 380 | P/E | 5--10 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
A780 | p-type Si:B | [100] | 3" | 380 | P/E | 5--10 | SEMI TEST - Broken wafers removed from cassette but not re-cleaned, 2Flats, TTV<5μm, in Unsealed Empak cst |
7778 | p-type Si:B | [100] | 3" | 300 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
K342 | p-type Si:B | [100] | 3" | 300 | P/P | 1-100 | Prime, Empak cst |
G286 | p-type Si:B | [100] | 3" | 375 | P/P | 1-100 {1.6-5.5} | SEMI Prime, 2Flats, Front-side Prime, back-side non-Prime polished, TTV<4μm, Empak cst |
10383 | p-type Si:B | [100] | 3" | 380 | P/P | 1--10 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
A0383 | p-type Si:B | [100] | 3" | 380 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
10801 | p-type Si:B | [100] | 3" | 380 | P/P | 1--10 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
A0801 | p-type Si:B | [100] | 3" | 380 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
I733 | p-type Si:B | [100] | 3" | 380 | FeP/E | 1-100 | SEMI Prime, 2Flats, with Thin film of Iron (Fe), 25±15nm thick on polished side, Empak cst |
E563 | p-type Si:B | [100] | 3" | 381 | P/P | 1--30 | SEMI Prime, 2Flats, Ultra-Low TTV<1μm, Empak cst |
S5865 | p-type Si:B | [100-6° towards[110]] ±0.5° | 3" | 381 | P/E | 1--10 | SEMI Prime, 2Flats, Empak cst |
S5880 | p-type Si:B | [100-6° towards[110]] ±0.5° | 3" | 381 | P/E | 1--10 | SEMI TEST (Defects, unsealed), 2Flats, Empak cst |
6826 | p-type Si:B | [100] | 3" | 475 | P/P | 1--50 | SEMI Prime, 2Flats, Ultra flat TTV<0.3μm, Empak cst |
P343 | p-type Si:B | [100] | 3" | 500 | P/P | 1-100 | Prime, 1Flat, Empak cst |
O344 | p-type Si:B | [100] | 3" | 600 | P/P | 1-100 | Prime, 1Flat, Empak cst |
J301 | p-type Si:B | [100] | 3" | 625 | P/P | 1--30 | SEMI Prime, 2Flats, TTV<2μm, Empak cst |
10311 | p-type Si:B | [100] | 3" | 2,000 | P/P | 1--20 | SEMI Prime, 2Flats, Individual cassettes sealed in groups of 5 |
B0583 | p-type Si:B | [100] | 3" | 2,000 | P/P | 1--20 | SEMI Prime, 2Flats, Individual cassettes sealed in groups of 10 |
C0583 | p-type Si:B | [100] | 3" | 2,000 | P/P | 1--20 | SEMI Prime, 2Flats, Individual cst |
K056 | p-type Si:B | [100] | 3" | 5,000 | P/E | 1--20 | Prime, NO Flats, Individual cst |
F010 | p-type Si:Ga | [100] | 3" | 380 | P/E | 0.76-1.00 | SEMI Prime, 1Flat, Empak cst |
4394 | p-type Si:B | [100] | 3" | 300 | P/P | 0.5-10.0 | SEMI Prime, 1Flat, TTV<2μm, Empak cst |
S5853 | p-type Si:B | [100] | 3" | 315 | P/P | 0.5-10.0 | SEMI Prime, 1Flat, TTV<3μm, Empak cst |
L271 | p-type Si:B | [100] ±1° | 3" | 318 ±7 | P/P | 0.5-10.0 | SEMI Prime, 2Flats, TTV<1μm, Empak cst |
I270 | p-type Si:B | [100] ±1° | 3" | 889 ±13 | P/P | 0.5-10.0 | SEMI Prime, 2Flats, TTV<8μm, Empak cst |
S5610 | p-type Si:B | [100] | 3" | 890 ±13 | P/P | 0.5-10.0 | SEMI, TTV<8μm, Empak cst |
T206 | p-type Si:B | [100] | 3" | 3,050 ±50 | C/C | >0.5 | 1Flat, Individual cst (can be ordered singly) |
3014 | p-type Si:B | [100] | 3" | 250 | P/E | 0.15-0.20 | SEMI TEST (Scratches), 2Flats, Empak cst |
J014 | p-type Si:B | [100] | 3" | 250 | BROKEN | 0.15-0.20 | Broken wafers, in Epak cst |
H558 | p-type Si:B | [100] | 3" | 356 | P/P | 0.015-0.020 | SEMI Prime, 2Flats, Empak cst |
I600 | p-type Si:B | [100] | 3" | 185 | P/P | 0.01-0.04 | SEMI Prime, 1Flat, Empak cst |
S5843 | p-type Si:B | [100-4° towards[110]] ±0.5° | 3" | 230 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
2248 | p-type Si:B | [100] | 3" | 300 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
G989 | p-type Si:B | [100] | 3" | 380 | P/P | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
10215 | p-type Si:B | [100] | 3" | 380 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
5907 | p-type Si:B | [100] | 3" | 380 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
7140 | p-type Si:B | [100] | 3" | 380 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
S5844 | p-type Si:B | [100-4° towards[110]] ±0.5° | 3" | 381 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, TTV<5μm, Empak cassettes of 4 and 20 wafers |
S5801 | p-type Si:B | [100] | 3" | 435 ±10 | E/E | 0.01-0.02 {0.011-0.013} | SEMI, 2Flats, coin roll |
10151 | p-type Si:B | [100] | 3" | 150 ±15 | P/P | 0.005-0.008 | SEMI Prime, 1Flat, Empak cst |
TS129 | p-type Si:B | [100] | 3" | 381 | P/E | 0.002-0.005 {0.0032-0.0041} | SEMI Prime, 2Flats, TTV<5μm, Striation-Free, Empak cst |
TS130 | p-type Si:B | [100] | 3" | 381 | P/E | 0.002-0.005 {0.0037-0.0039} | SEMI Prime, 2Flats, TTV<7μm, Striaton-Free, Empak cst |
D414 | p-type Si:B | [100] | 3" | 380 | P/P | 0.001-0.005 | SEMI Prime polish, 2Flats, Visible striation marks, Empak cst |
10688 | p-type Si:B | [100] | 3" | 380 ±15 | P/E | 0.001-0.005 | SEMI Prime, Empak cst |
10510 | p-type Si:B | [100] | 3" | 50 ±5 | P/P | <0.01 {0.002-0.003} | SEMI Prime, 2Flats, Empak cst |
A0510 | p-type Si:B | [100] | 3" | 50 ±5 | P/P | <0.01 {0.002-0.003} | SEMI Prime, 2Flats, Empak cst |
B0510 | p-type Si:B | [100] | 3" | 50 ±5 | P/P | <0.01 {0.002-0.003} | SEMI Prime, 2Flats, Empak cst |
S5866 | p-type Si:B | [100] | 3" | 390 ±10 | E/E | <100 | SEMI, 2Flats, coin roll |
3366 | p-type Si:B | [5,5,12] ±0.5° | 3" | 380 | P/E | 1--10 | SEMI Prime, 1Flat, Empak cst |
D331 | p-type Si:B | [211] ±0.5° | 3" | 525 | P/E | >10 | SEMI Prime, 1Flat, Empak cst |
2335 | p-type Si:B | [111-28° towards[001]] ±0.5° | 3" | 400 | P/E | >20 | SEMI TEST (Half of wafers polished on wrong side, some have etch patterns), Primary Flat @ <112>, hard cst |
10728 | p-type Si:B | [111-4°] ±0.5° | 3" | 380 | P/E | 8--12 | SEMI Prime, 1Flat, Empak cst |
6949 | p-type Si:B | [111] | 3" | 2,300 | P/P | 4--7 | SEMI Prime, 1Flat, Individual cst |
8193 | p-type Si:B | [111] | 3" | 500 | P/E | 2--6 | SEMI Prime, 1Flat, Empak cst |
A068 | p-type Si:B | [111] ±0.5° | 3" | 458 | P/P | 0.80-1.05 | SEMI Prime, 1Flat, Empak cst |
H120 | p-type Si:B | [111-4°] ±0.5° | 3" | 381 | P/EOx | 0.01-0.02 {0.0145-0.0148} | SEMI Prime, 1Flat, Back-side LTO 0.35±0.05μm thick, Empak cst |
6464 | p-type Si:B | [111-4.0° towards[112]] ±0.5° | 3" | 406 | P/E | 0.005-0.015 | SEMI Prime, 1Flat, Empak cst |
7157 | p-type Si:B | [111] ±0.5° | 3" | 600 | P/P | 0.005-0.020 | SEMI Prime, 1Flat, Empak cst |
S5909 | p-type Si:B | [111-4° towards[-211]] ±0.5° | 3" | 890 | P/E | 0.001-0.005 | SEMI TEST (Can be repolished), 2Flats, Soft cst |
A208 | n-type Si:P | [510] ±0.5° | 3" | 1,000 | P/E | 1-100 | Prime, NO Flats, Back-side rough etched, Empak cst |
F092 | n-type Si:P | [110] ±0.5° | 3" | 381 | P/E | 15-Nov | SEMI Prime, 2Flats, TTV<15μm, Individual cst |
C720 | n-type Si:P | [110] ±0.5° | 3" | 381 | P/E | 1--10 | SEMI Prime, SEMI Flat (one) @ [1,-1,0], in Empak cassettes of 7 wafers |
B788 | n-type Si:As | [110] ±0.5° | 3" | 420 | P/P | 0.001-0.007 | SEMI Prime, Primary Flat @ [1,-1,0], Empak cst |
7071 | n-type Si:P | [100] | 3" | 300 | P/P | 30-Oct | SEMI Prime, 2Flats, Empak cst |
C384 | n-type Si:P | [100] | 3" | 300 | P/P | 30-Oct | SEMI Prime, 2Flats, Empak cst |
L693 | n-type Si:P | [100] | 3" | 380 | P/E | 7.4-9.4 | Prime, 2Flats, Empak cst |
B0169 | n-type Si:P | [100] | 3" | 500 ±15 | P/E | 6--9 | SEMI Prime, 1Flat, Empak cst |
10131 | n-type Si:P | [100] | 3" | 381 | P/E | 5--10 | SEMI Prime, 1Flat, TTV<5μm, Empak cst |
H263 | n-type Si:P | [100] | 3" | 381 | P/E | 5--10 | SEMI TEST (Broken wafer removed but not re-cleaned, 1Flat, TTV<5μm, Empak cst |
6711 | n-type Si:P | [100] | 3" | 250 | P/P | 2--20 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
C038 | n-type Si:P | [100] | 3" | 380 | P/P | 1.25-2.50 | SEMI Prime, 1Flat, Empak cst |
8038 | n-type Si:P | [100] | 3" | 380 | P/E | 1.25-2.50 | SEMI Prime, 1Flat, Empak cst |
B038 | n-type Si:P | [100] | 3" | 380 | P/E | 1.25-2.50 | SEMI Prime, 1Flat, Empak cst |
B0233 | n-type Si:P | [100] | 3" | 300 ±10 | P/P | 1--10 | SEMI Prime, 2Flats, TTV<1μm, Empak cst |
A0564 | n-type Si:P | [100] | 3" | 350 | P/P | 1--3 | SEMI Prime, 2Flats, TTV<1μm, Empak |
D316 | n-type Si:P | [100] | 3" | 350 | P/P | 1--3 | SEMI Prime, 2Flats, Empak cst |
C0169 | n-type Si:P | [100] | 3" | 380 | P/E | 1--10 | SEMI Prime, 2Flats, Empak cst |
E252 | n-type Si:P | [100] | 3" | 381 | P/P | 1-20 {1.25-2.50} | SEMI Prime, 1Flat, TTV<1μm, Empak cst |
N150 | n-type Si:P | [100] | 3" | 381 | P/P | 1--5 | SEMI Prime, 1Flat, TTV<5μm, Bow/Warp<10μm, Empak cst |
S5929 | n-type Si:P | [100] | 3" | 400 | P/E | 1--50 | SEMI Test, 1Flat, Empak cst |
A312 | n-type Si:P | [100] | 3" | 450 | P/P | 1--10 | SEMI Prime, 1Flat, LaserMark, TTV<2μm, Bow/Warp<10μm, Empak cst |
S5856 | n-type Si:P | [100-4°] ±0.5° | 3" | 500 | P/E | 1--20 | Prime, 2Flats, Empak cst |
H313 | n-type Si:P | [100] | 3" | 650 | P/P | 1--10 | SEMI Prime, 1Flat, LaserMark, TTV<2μm, Bow/Warp<10μm, Empak cst |
10873 | n-type Si:P | [100] | 3" | 5,000 | P/E | 1-100 | SEMI Prime, 1Flat, Individual cst |
S5921 | n-type Si:P | [100] | 3" | 7,620 ±100 | P/E | 1--10 | SEMI, TEST (Edge Chips), NO Flats, Pack of 2 wafers |
J763 | n-type Si:Sb | [100] | 3" | 300 | P/E | 0.02-0.04 | SEMI Prime, 2Flats, in hard cassettes of 2 wafers |
10061 | n-type Si:Sb | [100] | 3" | 380 | P/E | 0.008-0.020 | SEMI Prime, 2Flats, Empak cst |
4200 | n-type Si:Sb | [100] | 3" | 381 | P/E | 0.008-0.020 {0.013-0.019} | SEMI Prime, 2Flats, TTV<7μm, Bow<15μm, Warp<25μm, in Empak cassettes of 24 wafers |
U156 | n-type Si:As | [100] | 3" | 300 | P/P | 0.001-0.005 | SEMI Prime, 1Flat, Back-side has a non-Prime polish, Empak cst |
4096 | n-type Si:As | [100] | 3" | 380 | P/EOx | 0.001-0.005 | SEMI Prime, 2Flats, LTO Back-side seal 0.5μm thick, TTV<6μm, Bow<15μm, Empak cst |
10742 | n-type Si:As | [100] | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Bow/Warp<30μm, Empak cst |
6354 | n-type Si:As | [100] | 3" | 380 | P/E | 0.001-0.005 | SEMI Non-Prime Surface Quality, 2Flats, TTV<5μm, Empak cst |
8088 | n-type Si:P | [100] | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
TS041 | n-type Si:As | [100] | 3" | 889 | P/EOx | 0.001-0.005 {0.0028-0.0037} | SEMI Prime, 2Flats, Back-side LTO 500nm thick, Empak cst |
1912 | n-type Si:As | [211] ±0.5° | 3" | 550 | E/E | 0.0030-0.0042 | SEMI Prime, 1Flat, in Empak cassettes of 7, 8 & 8 wafers |
2707 | n-type Si:P | [111-4°] ±0.5° | 3" | 250 | P/E | 50-220 {61-95} | Prime, NO Flats, Empak cst |
5721 | n-type Si:P | [111] ±0.5° | 3" | 1,500 | P/P | 31-35 | SEMI Prime, 1Flat, Empak cassettes of 10 + 10 + 9 wafers |
1263 | n-type Si:P | [111] ±0.5° | 3" | 1,400 | P/E | 25-35 | SEMI Prime, 1Flat, in single wafer cassettes, sealed in groups of 5 |
G271 | n-type Si:P | [111] ±0.5° | 3" | 500 | P/E | >10 | SEMI Prime, 1Flat, Empak cst |
E206 | n-type Si:P | [111-5° towards[110]] ±0.25° | 3" | 1,000 | P/E | >5 | SEMI Prime, 1Flat, hard cst |
G206 | n-type Si:P | [111-5° towards[110]] ±0.25° | 3" | 1,000 | P/E | >5 | SEMI Prime, 1Flat, in hard cassettes of 6, 6 & 7 wafers |
S5804 | n-type Si:P | [111-0.5° towards[110]] ±0.25° | 3" | 1,400 | E/E | >5 | SEMI, 1Flat, LaserMark, in unsealed hard cast |
S5552 | n-type Si:P | [111] ±0.5° | 3" | 380 | P/E | 10-Jan | SEMI Prime, Empak cst |
D917 | n-type Si:P | [111-3.0°] ±1° | 3" | 381 ±50 | P/E | 1-20 {1.7-5.7} | SEMI TEST, 2Flats, Empak cst |
TS001 | n-type Si:P | [111-3.0°] ±1° | 3" | 381 | P/E | 1-20 {3-8} | SEMI Prime, 2Flats, TTV<5μm, Bow<8μm, Warp<16μm, Empak cst |
F136 | n-type Si:P | [111] ±0.5° | 3" | 1,000 | P/P | 0.5-2.0 | SEMI Prime, 2Flats, Empak cst |
2256 | n-type Si:Sb | [111] ±0.5° | 3" | 380 | P/E | 0.019-0.026 | SEMI Prime, 2Flats, in Empak cassettes of 5 wafers |
7513 | n-type Si:Sb | [111-3°] | 3" | 300 | P/E | 0.011-0.016 | SEMI Prime, 2Flats, Empak cst |
A118 | n-type Si:Sb | [111] ±0.5° | 3" | 305 ±5 | P/P | 0.01-0.02 | Prime, 2Flats, Empak cst |
4296 | n-type Si:Sb | [111] | 3" | 380 | P/E | 0.008-0.025 | SEMI Prime, 2Flats, Empak cst |
TS024 | n-type Si:Sb | [111-3.5°] ±0.5° | 3" | 381 | P/E | 0.008-0.016 {0.0142-0.0155} | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
TS131 | n-type Si:Sb | [111-3.5°] ±0.5° | 3" | 381 | P/E | 0.008-0.016 {0.0118-0.0133} | SEMI Prime, 2Flats, TTV<6μm, Empak cst |
S5845 | n-type Si:Sb | [111-3.5°] ±0.5° | 3" | 380 | P/E | 0.005-0.050 | SEMI Prime, 2Flats, Empak cst |
TS025 | n-type Si:Sb | [111-2.5°] ±0.5° | 3" | 381 | P/E | 0.005-0.016 {0.0125-0.0130} | SEMI Prime, 1Flat, TTV<5μm, Empak cst |
TS070 | n-type Si:Sb | [111-2.5°] ±0.5° | 3" | 381 | P/E | 0.005-0.016 | SEMI Prime, 1Flat, TTV<5μm, Empak cst |
TS056 | n-type Si:Sb | [111-1.5°] ±0.5° | 3" | 700 | P/E | 0.005-0.018 {0.0154-0.0172} | SEMI Prime, 2Flats, Empak cst (14+15 wafers) |
TS022 | n-type Si:As | [111-3°] ±0.5° | 3" | 381 | P/E | 0.002-0.004 {0.0025-0.0028} | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
TS133 | n-type Si:As | [111-3°] ±0.5° | 3" | 381 | P/E | 0.002-0.004 {0.0023-0.0028} | SEMI Prime, 2Flats, Empak cst |
6431 | n-type Si:As | [111] ±0.5° | 3" | 320 | P/P | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
6385 | n-type Si:As | [111] ±0.5° | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
6530 | n-type Si:As | [111] ±0.5° | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
E380 | n-type Si:As | [111-4°] ±0.5° | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, Empak cst |
F385 | n-type Si:As | [111-4°] ±0.5° | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
G385 | n-type Si:As | [111] ±0.5° | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
D691 | n-type Si:As | [111] | 3" | 381 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, Empak cst |
TS023 | n-type Si:As | [111-3°] ±0.5° | 3" | 381 | P/E | 0.0010-0.0045 {0.0027-0.0037} | SEMI Prime, 2Flats, Empak cst |
TS026 | n-type Si:As | [111-2.5°] ±0.5° | 3" | 381 | P/E | 0.001-0.005 {0.0030-0.0032} | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
TS071 | n-type Si:As | [111-2.5°] ±0.5° | 3" | 381 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, TTV<5μm, Bow<10μm, Warp<15μm, Empak cst (6+14 wafers) |
TS134 | n-type Si:As | [111-3°] ±0.5° | 3" | 381 | P/E | 0.001-0.005 {0.0033-0.0035} | SEMI Prime, 2Flats, TTV<6μm, Empak cst |
TS135 | n-type Si:As | [111-3°] ±0.5° | 3" | 381 | P/E | 0.001-0.005 {0.0036-0.0042} | SEMI Prime, 2Flats, Empak cst |
TS046 | n-type Si:As | [111-4°] | 3" | 889 | P/EOx | 0.001-0.004 {0.0032-0.0035} | SEMI Prime, 2Flats, Back-side: LTO 500nm, Empak cst |
S5858 | n-type Si:As | [112-3° towards[111]] ±0.5° | 3" | 890 | P/E | 0.002-0.003 | Prime, 2Flats, Empak cst |
C000 | Si | 3" | 300 ±50 | P/P | Prime polish, Unlabeled wafers, Very good surface, other specifications unknown, Empak cst | ||
1855 | p-type Si:B | [100] | 3" | 380 | OxP/EOx | 10--20 | SEMI Prime, 2Flats, DRY Thermal Oxide (5-7)nm thick, on both sides, hard cst |
10735 | n-type Si:P | [100] | 3" | 381 | OxP/EOx | 5--10 | SEMI Prime, 1Flat, TTV<5μm, Wet Thermal Oxide (SiO2) 300±21 nm (±7%) thick on both sides, Empak cst |
S5777 | Si | ??? | 3" | ? | P/P | ? | SEMI TEST (Unsealed), Empak cst |
S5778 | Si | 3" | P/P | SEMI TEST (Unsealed), Empak cst | |||
A0645 | p-type Si:B | [100] | 3" | 600 | P/P | FZ >3,000 | SEMI Prime, 2Flats, Empak cst |
C0645 | p-type Si:B | [100] | 3" | 625 | P/E | FZ >3,000 | SEMI, 2Flats, Empak cst |
B0572 | p-type Si:B | [100] | 3" | 500 | P/P | FZ 0.5-10.0 | SEMI Prime, 2Flats, Empak cst |
A0344 | n-type Si:P | [100] ±0.1° | 3" | 350 | P/E | FZ >5,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, Empak cst |
D994 | n-type Si:P | [100] ±0.1° | 3" | 380 | P/E | FZ >5,000 | SEMI TEST (Bad Lasermark on back). To use with a chuck, light polish needed on back-side, 1Flat, Empak cst |
4210 | n-type Si:P | [100] | 3" | 381 | P/P | FZ 100-500 | SEMI Prime, 2Flats, Empak cst |
F210 | n-type Si:P | [100] | 3" | 381 | P/P | FZ 100-500 | SEMI Prime, 2Flats, Empak cst |
B0529 | n-type Si:P | [100] | 3" | 525 | P/P | FZ 0.5-1.0 | SEMI, 2Flats, Empak cst |
J707 | n-type Si:P | [111] ±0.5° | 3" | 360 | P/E | FZ >5,000 | SEMI Prime, 1Flat, Empak cst |
S5613 | n-type Si:P | [111] ±1° | 3" | 400 | P/P | FZ 182-196 | SEMI Prime, 1Flat, TTV<3μm, Empak cst |
I914 | n-type Si:P | [111] ±1.0° | 3" | 450 | P/P | FZ 182-196 | SEMI Prime, 1Flat, Empak cst |
S5628 | n-type Si:P | [111] ±1° | 3" | 500 | P/E | FZ 182-196 | SEMI TEST, 1Flat, Empak cst |
10G2 | n-type Si:P | [111] | 3" | 300 | P/E | FZ 61-95 | Prime, NO Flats, Empak cst |
C034 | Intrinsic Si:- | [100] | 3" | 320 | P/P | FZ >20,000 | SEMI Prime, 1Flat, TTV<2μm, Empak cst |
A0649 | Intrinsic Si:- | [100] | 3" | 350 | P/E | FZ >20,000 | SEMI Prime, 1Flat, MCC Lifetime>1,000μs, LaserMark, Empak cst |
G975 | Intrinsic Si:- | [100] | 3" | 500 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
K843 | Intrinsic Si:- | [100] | 3" | 700 | P/P | FZ >10,000 | SEMI Prime, 1Flat, TTV<1μm, MCC Lifetime>1,000μs, Empak cst |
11Z1 | Intrinsic Si:- | [100] | 3" | 500 | P/E | FZ <480 | SEMI Prime, 1Flat, Empak cst |
A103 | Intrinsic Si:- | [111] ±0.5° | 3" | 380 | P/P | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
8103 | Intrinsic Si:- | [111] ±0.5° | 3" | 380 | P/E | FZ >20,000 | SEMI Prime, 1Flat, Empak cst |
K730 | Intrinsic Si:- | [111] ±0.5° | 3" | 350 | P/P | FZ >17,500 | SEMI Prime, 1Flat, TTV<5μm, Empak cst |
A730 | Intrinsic Si:- | [111] ±0.5° | 3" | 465 | P/P | FZ >15,000 | SEMI Prime, 1Flat, Empak cst |
4154 | p-type Si:B | [110] ±0.5° | 3" | 360 | P/P | 1--10 | SEMI Prime, 2Flats (PF at <111>±0.5°, SF at <111> 109.5° CW from PF), Ultra-Low TTV<1μm, Empak cst |
12J1 | p-type Si:B | [110] | 3" | 380 | P/E | 1--10 | 1 F @ <1,-1,0> |
11X | p-type Si:B | [100] | 3" | 380 | P/P | 80-170 | SEMI Prime, 2Flats, Empak cst |
11S2 | p-type Si:B | [100] | 3" | 300 | P/P | 30-35 | SEMI Prime, 2Flats, Empak cst |
G319 | p-type Si:B | [100] | 3" | 600 | P/P | 7--10 | SEMI, 2Flats, Empak cst |
12N3 | p-type Si:B | [100] | 3" | 300 | P/E | 5--20 | PF <110> |
11V2 | p-type Si:B | [100] | 3" | 350 | P/E | 5--20 | SEMI Prime, 2Flats, Empak cst |
11U | p-type Si:B | [100] | 3" | 300 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
11T3 | p-type Si:B | [100] | 3" | 350 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
H710 | p-type Si:B | [100] | 3" | 350 | P/P | 1--20 | SEMI Prime, 2Flats, TTV<3μm, Empak cst |
E649 | p-type Si:B | [100] | 3" | 380 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
11R1 | p-type Si:B | [100] | 3" | 380 | P/E | 1--20 | SEMI Prime, 1Flat, Empak cst |
12A1 | p-type Si:B | [100] | 3" | 380 | P/E | 1--20 | SEMI Prime, 2Flats, Empak cst |
E310 | p-type Si:B | [100-0.2° towards[011]] ±0.1° | 3" | 380 ±15 | P/E | 1-100 | Prime, 1Flat, Empak cst |
D563 | p-type Si:B | [100] | 3" | 381 | P/P | 1--30 | SEMI Prime, 2Flats, Empak cst |
Q008 | p-type Si:B | [100] | 3" | 450 | P/P | 1--50 | SEMI Prime, 2Flats, TTV<2μm, Empak cst |
R008 | p-type Si:B | [100] | 3" | 450 | P/P | 1--50 | Prime, 2Flats, TTV<3μm, Empak cst |
S5874 | p-type Si:B | [100] ±1° | 3" | 500 | P/P | 1--10 | SEMI Prime, TTV<1μm, Empak cst |
B0406 | p-type Si:B | [100] | 3" | 600 | P/P | 1-100 | SEMI Prime, 1Flat, Empak cst |
B859 | p-type Si:B | [100] | 3" | 600 | P/P | 1-100 | SEMI Prime, 1Flat, TTV<3μm,, with LaserMark, Empak cst |
K301 | p-type Si:B | [100] | 3" | 600 | P/P | 1--30 | SEMI Prime, 2Flats, TTV<2μm, Empak cst |
A0304 | p-type Si:B | [100] | 3" | 630 | P/P | 1-100 | SEMI Prime, 2Flats, TTV<1μm, Empak cst |
A0583 | p-type Si:B | [100] | 3" | 1,975 | P/P | 1--20 | SEMI Prime, 2Flats, Empak cst |
J270 | p-type Si:B | [100] ±1° | 3" | 875 | P/P | 0.5-10.0 | SEMI Prime, 2Flats, Empak cst |
S5677 | p-type Si:B | [100] | 3" | 880 | P/P | 0.5-10.0 | SEMI, TTV<8μm, Empak cst |
13H1 | p-type Si:B | [100] | 3" | 350 | P/E | 0.1-0.2 | SEMI Prime, 2Flats, Empak cst |
12S1 | p-type Si:B | [100] | 3" | 400 | P/P | 0.015-0.016 | SEMI Prime, 2Flats, Empak cst |
S5923 | p-type Si:B | [100] | 3" | 200 | P/P | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
S5922 | p-type Si:B | [100] | 3" | 200 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
5761 | p-type Si:B | [100-4° towards[110]] ±0.5° | 3" | 225 | P/E | 0.01-0.02 | SEMI Prime, Empak cst |
A0647 | p-type Si:B | [100] | 3" | 350 | P/P | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
H211 | p-type Si:B | [100] | 3" | 350 | P/E | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
S5886 | p-type Si:B | [100-4° towards[110]] ±0.5° | 3" | 381 | P/E | 0.01-0.02 | SEMI Prime, Empak cst |
12T1 | p-type Si:B | [100] | 3" | 380 | P/E | 0.003-0.004 | SEMI Prime, 2Flats, Empak cst |
13D3 | p-type Si:B | [100] | 3" | 300 | P/E | 0.002-0.003 | SEMI Prime, 2Flats, Empak cst |
13F4 | p-type Si:B | [100] | 3" | 525 | P/E | 0.0020-0.0027 | SF @ 45° |
I317 | p-type Si:B | [100] | 3" | 370 | P/E | 0.001-0.005 | SEMI Prime, Empak cst |
A0703 | p-type Si:B | [100] | 3" | 375 | P/P | 0.001-0.005 | SEMI Prime, 2Flats, TTV<2μm, Empak cst |
12X1 | p-type Si:B | [100] | 3" | 380 | P/E | 0.001-0.005 | SEMI Prime, 2Flats, Empak cst |
A0139 | p-type Si:B | [100] | 3" | 381 | P/E | 0.001-0.005 | Prime, NO Flats, Empak cst |
B0139 | p-type Si:B | [100] | 3" | 381 | P/E | 0.001-0.005 | Prime, NO Flats, Empak cst |
E750 | p-type Si:B | [100] | 3" | 400 | P/P | <1 | SEMI Prime, 2Flats, TTV<5μm, Empak cst |
12R2 | p-type Si:B | [911] | 3" | 380 | P/E | 5--6 | PF <110> |
9O2 | p-type Si:B | [111] | 3" | 380 | P/E | 18-21 | SEMI Prime, 1Flat, Empak cst |
9T2 | p-type Si:B | [111] | 3" | 775 | P/E | 13-14 | Prime, NO Flats, Empak cst |
10L1 | p-type Si:B | [111] | 3" | 1,000 | P/E | 10--20 | Prime, NO Flats, Empak cst |
A0711 | p-type Si:B | [111-4°] ±0.5° | 3" | 365 | P/P | 8--12 | SEMI Prime, 1Flat, Empak cst |
9N1 | p-type Si:B | [111-4°] | 3" | 380 | P/E | 8--12 | SEMI Prime, 1Flat, Empak cst |
10A1 | p-type Si:B | [111] | 3" | 500 | P/E | 2--6 | SEMI Prime, 1Flat, Empak cst |
9U1 | p-type Si:B | [111] | 3" | 500 | P/E | 2--8 | SEMI Prime, 1Flat, Empak cst |
9S1 | p-type Si:B | [111] | 3" | 300 | P/E | 1.4-1.8 | Prime, NO Flats, Empak cst |
A567 | p-type Si:B | [111] ±0.1° | 3" | 330 ±10 | P/E | 1-100 | SEMI Prime, 1Flat, Empak cst |
10D1 | p-type Si:B | [111] | 3" | 800 | P/E | 1--20 | SEMI Prime, 1Flat, Empak cst |
10Z | p-type Si:B | [111] | 3" | 300 | P/P | 0.3-0.4 | SEMI Prime, 1Flat, Empak cst |
11B2 | p-type Si:B | [111] | 3" | 250 | P/E | 0.10-0.12 | SEMI Prime, 1Flat, Empak cst |
10T2 | p-type Si:B | [111] | 3" | 300 | P/E | 0.03-0.04 | SEMI Prime, 1Flat, Empak cst |
1.10E+03 | p-type Si:B | [111] | 3" | 380 | P/E | 0.014-0.015 | SEMI Prime, 1Flat, Empak cst |
10V1 | p-type Si:B | [111-1°] | 3" | 1,000 | P/E | 0.014-0.016 | SEMI Prime, 1Flat, Empak cst |
10W2 | p-type Si:B | [111-3.5°] | 3" | 300 | P/E | 0.004-0.005 | SEMI Prime, 1Flat, TTV<5μm, Empak cst |
S5911 | n-type Si:P | [110] ±0.5° | 3" | 750 | P/P | 10--30 | SEMI Prime, 1Flat at <1,-1,0>, Empak cst |
S5910 | n-type Si:P | [110] ±0.5° | 3" | 750 | P/E | 10--30 | SEMI Prime, 1Flat at <1,-1,0>, Empak cst |
20A2 | n-type Si:P | [100] | 3" | 9,500 | P/E | 15-22 | SEMI Prime, 1Flat, Individual cst |
12P | n-type Si:P | [100] | 3" | 300 | P/E | 10--20 | SEMI Prime, 1Flat, Empak cst |
20D2 | n-type Si:P | [100] | 3" | 3,000 | P/E/P | 12-Oct | Prime, NO Flats, Individual cst |
12L2 | n-type Si:P | [100] | 3" | 1,000 | P/E | 6--10 | Prime, NO Flats, Empak cst |
19R3 | n-type Si:P | [100] | 3" | 1,500 | P/E | 5--7 | SEMI Prime, 2Flats, Empak cst |
C379 | n-type Si:P | [100] | 3" | 381 | P/P | 1.25-2.50 | SEMI Prime, 2Flats, TTV<2μm, Empak cst |
11W2 | n-type Si:P | [100] | 3" | 300 | P/P | 1--20 | SEMI Prime, 2Flats, Empak cst |
A0233 | n-type Si:P | [100] | 3" | 300 | P/P | 1--10 | SEMI Prime, 2Flats, Empak cst |
E316 | n-type Si:P | [100] | 3" | 340 | P/P | 1--3 | SEMI Prime, 2Flats, Empak cst |
K860 | n-type Si:P | [100] | 3" | 345 | P/P | 1-100 | SEMI, 1Flat, Empak cst |
B0564 | n-type Si:P | [100] | 3" | 350 | P/P | 1--3 | SEMI Prime, 2Flats, Empak cst |
H714 | n-type Si:P | [100] | 3" | 350 | P/P | 1--25 | SEMI Prime, 1Flat, TTV<1μm, Empak cst |
S5904 | n-type Si:P | [100] | 3" | 350 | P/P | 1--3 | SEMI Prime, 2Flats, TTV<10μm, Empak |
S5905 | n-type Si:P | [100] | 3" | 350 | P/P | 1--3 | SEMI Prime, 2Flats, TTV<2μm, Empak cst |
S5906 | n-type Si:P | [100] | 3" | 350 | P/P | 1--3 | SEMI Prime, 2Flats, TTV<1μm, Empak cst |
A379 | n-type Si:P | [100] | 3" | 381 | P/P | 1--10 | SEMI Prime, 2Flats, TTV<1μm, Empak cst |
E818 | n-type Si:P | [100] | 3" | 381 | P/P | 1--30 | SEMI Prime, 2Flats, TTV<1.5μm, Empak cst |
M150 | n-type Si:P | [100] | 3" | 381 | P/P | 1--8 | SEMI Prime, 1Flat, TTV<5μm, Bow/Warp<10μm, Empak cst |
C312 | n-type Si:P | [100] | 3" | 450 | P/P | 1--10 | SEMI Prime, 1Flat, TTV<2μm, Empak cst |
S5878 | n-type Si:P | [100] | 3" | 500 | P/E | 1--10 | SEMI Prime, 1Flat, Empak cst |
12G1 | n-type Si:P | [100] | 3" | 600 | P/E | 1--10 | SEMI Prime, 2Flats, Empak cst |
L368 | n-type Si:P | [100] | 3" | 625 | P/P | 1--10 | SEMI Prime, 1Flat, TTV<5μm, LaserMark, Empak cst |
I313 | n-type Si:P | [100] | 3" | 650 | P/P | 1--10 | SEMI Prime, 1Flat, TTV<2μm, Empak cst |
1.20E+03 | n-type Si:P | [100] | 3" | 1,000 | P/E | 1-100 | Prime, NO Flats, Empak cst |
20J | n-type Si:P | [100] | 3" | 1,800 | P/P | 1--5 | SEMI Prime, 2Flats, Individual cst |
8261 | n-type Si:P | [100] | 3" | 5,000 | P/E | 1-100 | SEMI Prime, 1Flat, Individual cst |
A269 | n-type Si:P | [100] | 3" | 5,000 | P/E | 1-100 | SEMI Prime, 1Flat, Individual cst |
13A1 | n-type Si:Sb | [100] | 3" | 800 | P/E | 0.022-0.028 | SEMI Prime, 2Flats, Empak cst |
12Z | n-type Si:Sb | [100] | 3" | 500 | P/E | 0.021-0.022 | SEMI Prime, 2Flats, Empak cst |
11P2 | n-type Si:P | [211] | 3" | 450 | P/P | 50-65 | SEMI Prime, 2Flats, Empak cst |
10M1 | n-type Si:P | [111-4°] | 3" | 250 | P/E | 50-220 | Prime, NO Flats, Empak cst |
9V2 | n-type Si:P | [111-3°] | 3" | 380 | P/E | 19-25 | SEMI Prime, 2Flats, Empak cst |
H271 | n-type Si:P | [111] ±0.5° | 3" | 500 | P/E | >10 | Prime, 1Flat, Empak cst |
5804 | n-type Si:P | [111-0.5° towards[110]] ±0.25° | 3" | 1,400 | P/E | >5 | SEMI Prime, 1Flat, LaserMark, hard cst |
1.00E+03 | n-type Si:P | [111] | 3" | 525 | P/E | 4.5-5.0 | SEMI Prime, 2Flats, Empak cst |
10H1 | n-type Si:P | [111] | 3" | 500 | P/P | 4--6 | Prime, NO Flats, Empak cst |
10J1 | n-type Si:P | [111] | 3" | 250 | P/E | 1.0-5.5 | SEMI Prime, 2Flats, Empak cst |
9Q1 | n-type Si:P | [111] | 3" | 350 | P/E | 1--10 | SEMI Prime, 1 SEMI Flat, Empak cst |
20T | n-type Si:P | [111] | 3" | 6,000 | P/E | 1--20 | SEMI Prime, 2Flats, Individual cst |
A0499 | n-type Si:P | [111] ±0.5° | 3" | 400 | P/P | 0.80-0.99 | SEMI Prime, 1Flat, Empak cst |
10P3 | n-type Si:Sb | [111] | 3" | 300 | P/E | 0.019-0.026 | SEMI Prime, 2Flats, Empak cst |
11C2 | n-type Si:Sb | [111-3°] ±0.5° | 3" | 380 | P/E | 0.015-0.020 | SEMI Prime, 2Flats, Empak cst |
11D1 | n-type Si:Sb | [111-4°] | 3" | 380 | P/E | 0.015-0.017 | SEMI Prime, 2Flats, Empak cst |
11M2 | n-type Si:Sb | [111-2.5°] | 3" | 300 | P/E | 0.014-0.018 | SEMI Prime, 2Flats, Empak cst |
11L2 | n-type Si:Sb | [111-3.5°] | 3" | 380 | P/E | 0.014-0.016 | SEMI Prime, 2Flats, Empak cst |
10S1 | n-type Si:Sb | [111-3°] | 3" | 300 | P/E | 0.011-0.016 | SEMI Prime, 2Flats, Empak cst |
E118 | n-type Si:Sb | [111] ±0.5° | 3" | 300 | P/P | 0.01-0.02 | SEMI Prime, 2Flats, Empak cst |
G013 | n-type Si:Sb | [111] ±0.5° | 3" | 300 | P/P | 0.01-0.20 | SEMI Prime, 2Flats, Empak cst |
11A1 | n-type Si:Sb | [111] | 3" | 380 | P/E | 0.008-0.025 | SEMI Prime, 2Flats, Empak cst |
11J3 | n-type Si:As | [111-0.5°] | 3" | 380 | P/P | 0.003-0.005 | SEMI Prime, 2Flats, Empak cst |
11F1 | n-type Si:As | [111-2.5°] | 3" | 380 | P/E | 0.002-0.005 | SEMI Prime, 2Flats, Empak cst |
11G2 | n-type Si:As | [111-4°] | 3" | 380 | P/E | 0.002-0.005 | SEMI Prime, 2Flats, Empak cst |
11K5 | n-type Si:As | [111] | 3" | 380 | P/E | 0.002-0.005 | SEMI Prime, 1Flat, Empak cst |
A0134 | Si | [100] | 3" | 270 | P/P | 1-100 | Prime, NO Flats, TTV<5μm, Empak cst |
HI14c | n-type Si:P | [100] | 3" | 381 | OxP/EOx | 5--10 | SEMI Prime, 1Flat, TTV<5μm, Empak cst |